Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance-Reference-Cited by-同舟云学术

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Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance

Published:2021-02-01 Issue: Volume: Page:
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Container-title:2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Author:

Buschjager Sebastian,Chen Jian-Jia,Chen Kuan-Hsun,Gunzel Mario,Hakert Christian,Morik Katharina,Novkin Rodion,Pfahler Lukas,Yayla Mikail

Funder

Deutsche Forschungsgemeinshaft (DFG)

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9473901/9473226/09473918.pdf?arnumber=9473918

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3. Swift-CNN: Leveraging PCM Memory’s Fast Write Mode to Accelerate CNNs;IEEE Embedded Systems Letters;2023-12

4. Using Approximate DRAM for Enabling Energy-Efficient, High-Performance Deep Neural Network Inference;Embedded Machine Learning for Cyber-Physical, IoT, and Edge Computing;2023-10-01

5. Reliable Brain-inspired AI Accelerators using Classical and Emerging Memories;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

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