Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices
Author:
Affiliation:
1. Xi'an Jiaotong-Liverpool University,Department of Electrical and Electronic Engineering,215123 Suzhou,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9806820/9806821/09806866.pdf?arnumber=9806866
Reference53 articles.
1. Dynamic on-State Resistance Test and Evaluation of GaN Power Devices Under Hard- and Soft-Switching Conditions by Double and Multiple Pulses
2. Experimental Evaluation and Analysis of Switching Transient's Effect on Dynamic on-Resistance in GaN HEMTs
3. Hard-Switching Dynamic Rds,on Characterization of a GaN FET with an Active GaN-Based Clamping Circuit
4. An energy recovery clamp circuit for an isolated DC-DC GaN converter
5. Drain–Source Voltage Clamp Circuit for Online Accurate ON-State Resistance Measurement of SiC MOSFETs in DC Solid-State Power Controller
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