Scalable Multitasking Dynamic Pulse Based Reliability Stress Test for High Voltage Discrete Semiconductors
Author:
Affiliation:
1. KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH,Villach,Austria
2. Graz University of Technology,Electric Drives and Machines Institute,Graz,Austria
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9570185/9570186/09570461.pdf?arnumber=9570461
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4. Repetitive Unclamped-Inductive-Switching-Induced Electrical Parameters Degradations and Simulation Optimizations for 4H-SiC MOSFETs
5. Avalanche Robustness of SiC MPS Diodes, PCIM Europe 2016;basler;International Exhibition and Conference for Power Electronics Intelligent Motion Renewable Energy and Energy Management,2016
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