Author:
Huang Xuanyu,Zhang Rui,Huang Yu,Wang Peiyao,Li Mei
Cited by
4 articles.
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1. Autoencoder-Based Data Sampling for Machine Learning-Based Lithography Hotspot Detection;Proceedings of the 2022 ACM/IEEE Workshop on Machine Learning for CAD;2022-09-12
2. Autoencoder-Based Data Sampling for Machine Learning-Based Lithography Hotspot Detection;2022 ACM/IEEE 4th Workshop on Machine Learning for CAD (MLCAD);2022-09-12
3. Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning;2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR);2022-06
4. Hybrid Quantum-Classical Machine Learning for Lithography Hotspot Detection;2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC);2022-05-02