Analysis of Near-Field Probing Techniques for Immunity Tests-Reference-Cited by-同舟云学术

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Analysis of Near-Field Probing Techniques for Immunity Tests

Published:2022-05-23 Issue: Volume: Page:
ISSN:
Container-title:2022 ESA Workshop on Aerospace EMC (Aerospace EMC)
language:
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Author:

Wu Xinglong¹,Grassi Flavia¹,Spadacini Giordano¹,Pignari Sergio A.¹,Paoletti Umberto²,Hoda Isao²

Affiliation:

1. Politecnico di Milano,Dept. Electronics, Information and Bioengineering,Milan,Italy,20133

2. Center for Technology Innovation - Production Engineering, Research & Development Group, Hitachi Ltd,Yokohama,Japan,244-0817

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9828801/9828552/09828849.pdf?arnumber=9828849

Reference17 articles.

1. Performance of Electric Near-Field Probes for Immunity Tests

2. Development and validation of a wide band Near Field Scan probe for the investigation of the radiated immunity of Printed Circuit Boards

3. Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes

4. Evaluation of the near-field injection method at integrated circuit level

5. Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems

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