A Loss Tangent Measurement Surface for Free Space Focused Beam Characterization of Low-Loss Dielectrics
Author:
Affiliation:
1. Georgia Tech Research Institute,Advanced Concepts Laboratory,Atlanta,GA,USA
2. Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9954936/9954602/09954958.pdf?arnumber=9954958
Reference14 articles.
1. Permittivity measurement of thin dielectrics by using metamaterial absorbers inside a waveguide
2. Frequency-Selective Surface to Determine Permittivity of Industrial Oil and Effect of Nanoparticle Addition in X-Band
3. Dual-band measurement of complex permittivity in a microwave waveguide with a flexible, thin and sensitive metamaterial-based sensor
4. Quad-ridge dual polarized antenna for use in the 2–32GHz band
5. Improved Free-Space S-Parameter Calibration
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2. Design of a Tunable Frequency-Selective Surface for Microwave Material Measurement Applications;2023 Antenna Measurement Techniques Association Symposium (AMTA);2023-10-08
3. A Dual-Resonance Frequency Selective Surface Genetically Optimized for Dielectric Characterization;2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI);2023-07-23
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