Design of a Tunable Frequency-Selective Surface for Microwave Material Measurement Applications
Author:
Affiliation:
1. Georgia Tech Research Institute,Advanced Concepts Laboratory,Atlanta,GA,USA
2. School of Electrical and Computer Engineering, Georgia Institute of Technology,Atlanta,GA,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10293180/10293214/10293551.pdf?arnumber=10293551
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1. A 4.12 GHz, 3.3 mW VCO with 87.9% tuning range using a transformer-based variable inductance
2. RF MEMS Inductors and Their Applications—A Review
3. Broadband and thin magnetic absorber with non-Foster metasurface for admittance matching
4. Plans for Planar: Phase-Noise Reduction Techniques in Voltage-Controlled Oscillators
5. Q-factor measurement by using a Vector Network Analyser
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