Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition-Reference-Cited by-同舟云学术

Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition

Published:1993-11 Issue:11 Volume:47 Page:1742-1746
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Fan Qiang¹,Gohshi Yohich¹

Affiliation:

1. Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113, Japan

Abstract

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Enhancement in sensitivity on the order of 103 was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702934066064

Reference8 articles.

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