Raman Piezo-Spectroscopic Behavior of Aluminum Nitride-Reference-Cited by-同舟云学术

Raman Piezo-Spectroscopic Behavior of Aluminum Nitride

Published:1997-11 Issue:11 Volume:51 Page:1761-1765
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Murari Naoki¹,Sergo Valter¹,Pezzotti Giuseppe¹,Katagiri Gen¹,Meriani Sergio¹,Nishida Toshihiko¹

Affiliation:

1. Toray Research Center, Sonoyama, Otsu, Shiga 520, Japan (V.M., G.K.); Dipartimento di Ingegneria dei Materiali, I-34127 Trieste, Italy (V.S., S.M.); and Materials Department, Kyoto Institute of Technology, Matsugasaki, Kyoto 606, Japan (G.P., T.N.)

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702971939497

Reference8 articles.

1. High thermal conductivity aluminum nitride ceramic substrates and packages

2. Stress Measurement in Single-Crystal and Polycrystalline Ceramics Using Their Optical Fluorescence

3. Pressure Measurement Made by the Utilization of Ruby Sharp-Line Luminescence

4. Nye J. F., Physical Properties of Crystals (Clarendon Press, Oxford 1985), pp. 7–8.

5. Raman-scattering studies of aluminum nitride at high pressure

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