Probing Depth Study of Conversion Electron/He Ion Yield XAFS Spectroscopy on Strontium Titanate Thin Films.
Author:
Affiliation:
1. The New Industry Research Organization
2. Department of Chemistry, Graduate School of Science, Osaka University
3. Institute of Scientific and Industrial Research, Osaka University
4. Kanto Technical Institute, Kawasaki Heavy Industries, Ltd.
Publisher
Springer Science and Business Media LLC
Subject
Analytical Chemistry
Link
http://www.jstage.jst.go.jp/article/analsci/15/3/15_3_255/_pdf
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