Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces.-Reference-Cited by-同舟云学术

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Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces.

Published:2000 Issue:4 Volume:16 Page:403-406
ISSN:0910-6340
Container-title:Analytical Sciences
language:en
Short-container-title:Anal. Sci.

Author:

MORISHITA Tomohiro¹,HIBARA Akihide¹,SAWADA Tsuguo¹,TSUYUMOTO Isao²,HARATA Akira³

Affiliation:

1. Department of Applied Chemistry, School of Engineering, The University of Tokyo

2. Department of Environmental Systems Engineering, Kanazawa Institute of Technology

3. Department of Molecular Science and Technology, Graduate School of Engineering Science, Kyushu University

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://www.jstage.jst.go.jp/article/analsci/16/4/16_4_403/_pdf

Reference21 articles.

1. Photogenerated-Charge-Carrier-Induced Surface Reaction: No on Si(111)7×7

2. Alkali promotion of photodissociation of adsorbed Mo(CO)6

3. Ultrafast carrier dynamics on the Si(100)2×1 surface

4. Measurement of ultrafast hot‐carrier relaxation in silicon by thin‐film‐enhanced, time‐resolved reflectivity

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1. Molecularization of Metasurfaces for Multifunctional Ultrafast All‐Optical Terahertz Waves;physica status solidi (a);2024-07-17

2. Ultrafast carrier dynamics of aluminum-doped silicon film irradiated by femtosecond laser pulse;The European Physical Journal Applied Physics;2017-03

3. Ultrafast charge transfer in surface-enhanced Raman scattering (SERS) processes using transient reflecting grating (TRG) spectroscopy;Chemical Physics Letters;2007-01

4. Carrier Relaxation and Lattice Heating Dynamics in Silicon Revealed by Femtosecond Electron Diffraction;The Journal of Physical Chemistry B;2006-11-09

5. Use of reflection dynamic gratings for studying films and absorbing media;Quantum Electronics;2004-03-31

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