Broadband Rydberg atom-based radio-frequency field sensor

Author:

Jiao Yue-Chun ,Zhao Jian-Ming ,Jia Suo-Tang , ,

Abstract

Significant progress has been made in atom-based measurements of length, time, gravity and electromagnetic fields in recently years. Rydberg atom-based microwave electric field measurement, using electromagnetically induced transparency (EIT) in room temperature alkali-metal vapors, has been extensively investigated and aroused the broad interest. This approach may establish a new standard for the measurements of microwave (MW) and radio frequency (RF) electric fields.In this review, we describe the work on a new method of measuring electric fields based on quantum interference by using either cesium or rubidium atoms contained in a dielectric vapor cell. Rydberg atoms with principal quantum number n >>1 have large direct current (DC) polarizabilities and microwave transition dipole moments, thereby making them extremely sensitive to external electric fields. Using the Rydberg three-level EIT to detect the level splitting and shift that is induced by the external field, we can realize a rapid and robust self-calibration method of measuring the electric field in a frequency range from 0.01 GHz to 1000 GHz. For the MW electric field (frequency range > 1 GHz), the MW field causes the Rydberg states to split, known as an Autler-Townes splitting (A-T) effect when the applied microwave can resonate with adjacent Rydberg states. The MW coupled A-T splitting is proportional to the applied electric field strength, from which the field strength is measured. Using the EIT window, a high sensitivity of 3 μV·cm-1·Hz-1/2 and small electric field of 1 μV/cm are expected to be achieved with a modest setup, and the limitations of the sensitivity are also addressed in the review. For the RF field at frequency mj EIT lines, and avoided crossings formed with the fine-structure levels of equal mj and different J's, which is used to calibrate and measure the RF field amplitude. On the other hand, the dependence of the EIT-line strength on the RF field polarization provides a fast and robust polarization measurement of RF fields based on matching experimental data with a theoretical simulation. The measurements of minimum strengths and sensitivity of RF fields based on Rydberg atoms are one order magnitude below the values obtained by traditional antenna methods. The atom-based field measurement paves the way for determining fields through calibration-free, invariable atomic properties and miniaturization. We also propose its various potential applications in the future.

Publisher

Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences

Subject

General Physics and Astronomy

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