1. Shimoto T, Kikuchi K 2003 NEC Research & Development 44 213
2. Wang G T, Groothuis S, Ho P S 2003 Proceeding of the Electronic Components and Technology Conf., New Orleans, May27- 30, 2003 p727
3. Ho P S, Wang G T, Ding M, Zhao J H, Dai X 2004 Microelectronics Reliability 44 719
4. Banijamali B, Mohammed I, Savalia P 2009 Proceeding of the Electronic Components and Technology Conf., San Diego, May26-29, 2009 p293
5. Wang G T, Groothuis S, Ho P S 2004 Proceeding of the 42nd Annual Int. Reliability Physics Symp., Phoenix, April 25-30, 2004 p557