A single-element interferometer for measuring parallelism and uniformity of transparent plate

Author:

Lan Bin ,Feng Guo-Ying ,Zhang Tao ,Liang Jing-Chuan ,Zhou Shou-Huan , ,

Abstract

The transparent plates (such as organic glass, plastic plate) are widely used in the construction industry, high-tech products and scientific research applications, and its parallelism and uniformity measurement in the manufacture and quality control become more and more inevitable. Interferometer is a label-free, high-precision, and high-efficient device that can be used in many fields. According to a single-element interferometer, we demonstrate a measurement for the parallelism and uniformity of transparent medium. Beam-splitter cube is a key component. Half of plane wave laser source passes through the measured medium and the remaining half directly passes through the air, then these two halves with different optical paths meet in the beam-splitter cube. The parallelism or uniformity is determined by calculating interference fringe shift number during rotating the measured sample. The coherent beam is divided into two parts by a beam-splitter, one passes through the lens and then arrives at a photoelectric counter, and the other arrives at the observation plane of the charge-coupled device. The photoelectric counter is used to count the integer part of fringe shift number during rotating the sample; and the decimal part can be detected by calculating the phase difference of the two interferograms captured before and after rotation. The measurement principle of the proposed device is analyzed in detail, and the numerical simulations of the fringe shift number and the gray level changing with the sample rotation angle, the thickness and the refractive index of the sample are carried out. The simulation results show that the bigger the rotation angle, thickness and refractive index of the sample, the greater the fringe shift number will be. Therefore, the measurement accuracy can be improved by increasing the rotation angle and the thickness of the sample. In addition, we also simulate the measurement processes of two kinds of samples, which are unparallel and inhomogeneous transparent plates. The simulation results prove the feasibility and high accuracy of the proposed method. Finally, the optical experiment is conducted to demonstrate the practicability of the present device. The parallelism of a cuvette used for more than one year, is tested by our device. The results show that the difference in thickness between the cuvettes is on a micron scale, the peak-valley (PV) value is 9.92 m, and the root mean square (RMS) value is 2.2 m. And the difference between the contrast test results and the results from the proposed method is very small, the PV value is 0.569 m, and the RMS value is 0.131 m. The stability and repeatability of the proposed setup are tested in the experimental condition. The mean value and standard deviation of the fringe shift number during 30 min are 0.0012 and 0.0008, respectively. These results further testify the high accuracy and stability of our method. In conclusion, the performance of our measurement method is demonstrated with numerical simulation and optical experiment.

Publisher

Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences

Subject

General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3