Experimental study of residual stress of galvanized passive film based on XRD

Abstract

Residual stresses of galvanized passive film were measured by X-ray diffraction (XRD), at the same time, the residual stress distribution of galvanized passive film in the thickness direction was measured with electro-analysis polishing method, and the effect of residual stress on bonding strength of the film were analyzed. The experimental results show that residual stress of galvanized passive film is always compressive, which decreases as the residual stresses on the substrate surface increases. Residual stress of galvanized passive film in the thickness direction of 2—10μm is -274.5—-428.3MPa, and the residual stress distribution of galvanized passive film in the thickness direction has a gradient. Interfacial bonding strength of galvanized passive film/substrate is inversely proportional to the residual stress, and the decrease of the film stress improves the bonding strength.