Study of structural and electrical properties of thin NiOx films prepared by ion beam sputtering of Ni and subsequent thermo-oxidation-Reference-Cited by-同舟云学术

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Study of structural and electrical properties of thin NiOx films prepared by ion beam sputtering of Ni and subsequent thermo-oxidation

Published:2013-11 Issue:11 Volume:86 Page:
ISSN:1434-6028
Container-title:The European Physical Journal B
language:en
Short-container-title:Eur. Phys. J. B

Author:

Horak P.,Lavrentiev V.,Bejsovec V.,Vacik J.,Danis S.,Vrnata M.,Khun J.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1140/epjb/e2013-30969-6.pdf

Reference26 articles.

1. K. Yoshimura, T. Miki, S. Tanemura, Jpn J. Appl. Phys. 34, 2440 (1995)

2. M. Kitao, K. Izawa, K. Urabe, T. Komatsu, S. Kuwano, S. Yamada, Jpn J. Appl. Phys. 33, 6656 (1994)

3. J.W. Lee, I.H. Park, C.W. Chung, Integr. Ferroelectr. 74, 71 (2005)

4. D.G. Hwang, C.M. Park, S.S. Lee, J. Magn. Magn. Mater. 186, 265 (1998)

5. H. Kumagai, M. Matsumoto, K. Toyoda, M. Obara, J. Mater. Sci. Lett. 15, 1081 (1996)

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