One-step regression and classification with cross-point resistive memory arrays

Author:

Sun Zhong1ORCID,Pedretti Giacomo1,Bricalli Alessandro1,Ielmini Daniele1ORCID

Affiliation:

1. Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano and IU.NET, Piazza L. da Vinci 32, 20133 Milano, Italy.

Abstract

Machine learning algorithms such as linear regression are trained in one step with cross-point resistive memory arrays.

Funder

H2020 European Research Council

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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