Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy-Reference-Cited by-同舟云学术

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Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy

Published:2017-06-02 Issue:6 Volume:3 Page:
ISSN:2375-2548
Container-title:Science Advances
language:en
Short-container-title:Sci. Adv.

Author:

Wang Le¹,Wang Haomin¹,Wagner Martin²,Yan Yong³,Jakob Devon S.¹,Xu Xiaoji G.¹^ORCID

Affiliation:

1. Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, PA 18015, USA.

2. Bruker Nano, 112 Robin Hill Road, Santa Barbara, CA 93117, USA.

3. Department of Chemistry and Environmental Science, New Jersey Institute of Technology, Newark, NJ 07102, USA.

Abstract

A new scanning probe microscopy images the nanoscale world with synergistic force and infrared light at 10-nm spatial resolution.

Funder

Lehigh University

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Reference55 articles.

1. Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung;Abbe E.;Archiv für mikroskopische Anatomie,1873

2. Imaging Intracellular Fluorescent Proteins at Nanometer Resolution

3. Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy

4. Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM)

5. Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy. SHORT COMMUNICATION

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