Electron microscopy of electromagnetic waveforms

Abstract

Imaging electromagnetic waveforms Understanding the dynamics of electrons and the spatial and temporal evolution of electromagnetic fields within a material or device is often the key to optimizing performance. Ryabov and Baum show that electron microscopy can be used to measure collective carrier motion and electromagnetic fields with subcycle and subwavelength resolution. As an example, they used a train of compressed electron pulses to produce movies of the electromagnetic excitation in an optical excited metamaterial component. Science , this issue p. 374