Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography-Reference-Cited by-同舟云学术

Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography

Published:1966-02-04 Issue:3710 Volume:151 Page:562-568
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Bowman Harry R.¹,Hyde Earl K.¹,Thompson Stanley G.¹,Jared Richard C.¹

Affiliation:

1. Nuclear Chemistry Division, E. O. Lawrence Radiation Laboratory, University of California, Berkeley

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Reference19 articles.

1. ELAD, E, A PREAMPLIFIER WITH 0.7 KEV RESOLUTION FOR SEMICONDUCTOR RADIATION DETECTORS, NUCLEAR INSTRUMENTS & METHODS 37: 327 (1965).

2. Lawrence Radiation Laboratory Report 1965 UCRL-16390

3. FRECK, D.V., GAMMA-RAY SPECTRUM OBTAINED WITH A LITHIUM-DRIFTED P-I-N JUNCTION IN GERMANIUM, NATURE 193: 669 (1962).

4. IEEE Transactions in Nuclear Science 1964 A Survey of the Applications and Limitations of Various Types of Detectors in Radiation Energy Measurement

5. Goulding F. S. lectures given at Herceg-Novi Summer School for Physicists Aug. (1965).

Cited by 91 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray Spectrometry in the Era of Aberration-Corrected Electron Optical Beam Lines;Microscopy and Microanalysis;2023-01-14

2. Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope;Microscopy and Microanalysis;2021-12-09

3. The Beginnings of EDS in EPMA;Microscopy and Microanalysis;2018-08

4. The electronic age: energy-dispersive X-ray analysis and other modern techniques to the present and beyond;Powder Diffraction;2014-05-15

5. Atomic Excitation Exploited By Energetic-Beam Characterization Methods;Characterization of Materials;2012-10-12