Affiliation:
1. Photon Sciences Directorate, Argonne National Laboratory , Lemont, IL , USA
Abstract
Abstract
Aberration correction in the analytical transmission electron microscope is most closely associated with improvements in high-resolution imaging. In this paper, the combination of that technology with new system designs, which optimize both electron optics and x-ray detection, is shown to provide more than a tenfold increase in performance over the last 25 years.
Publisher
Oxford University Press (OUP)
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