Abstract
Polarization-sensitive photodetection enhances scene information capture, crucial for modern optoelectronic devices. One-dimensional (1D) materials with intrinsic anisotropy, capable of directly sensing polarized light, are promising for such photodetectors. NbTe4, a quasi-1D transition metal tetra-chalcogenide, offers significant benefits for polarization-sensitive photodetection due to its structural anisotropy. Nonetheless, to date, the anisotropic properties of 1D NbTe4 have not been reported. Herein, NbTe4 nanobelts were synthesized via mechanical exfoliation from needle-like bulk crystals, and their anisotropic and optoelectronic properties were comprehensively studied. Angle-resolved polarized Raman spectroscopy, in conjunction with azimuth-dependent reflectance difference microscopy, confirmed that 1D NbTe₄ exhibits intrinsic structural and in-plane optical anisotropy. 1D NbTe4 device demonstrated characteristic anisotropic photodetection behavior, achieving dichroic ratios of 1.16 at 671 nm and 1.24 at 1064 nm. The 1D NbTe4 device exhibits distinct anisotropic photodetection properties, achieving dichroic ratios of 1.16 at 671 nm and 1.24 at 1064 nm. Meanwhile, the device exhibits a pronounced photothermoelectric effect, conferring a broad spectral photoresponse ranging from visible to near-infrared wavelengths (532-1064 nm), with a rapid response time of 158 ms. This study demonstrates that NbTe4 inherently possesses in-plane anisotropy, making it a promising candidate for polarization-sensitive photodetection applications.