Affiliation:
1. National Research Nuclear University (NRNU) “MEPHI”, Moscow, Russian Federation
Abstract
Total ionizing dose (TID) effects and radiation tests of complex
multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs)
rise up some particularities as compared to conventional ?simple? ICs. The
main difficulty is to organize informative and quick functional tests
directly under irradiation. Functional tests approach specified for complex
multifunctional VLSI devices is presented and the basic radiation test
procedure is discussed in application to some typical examples.
Publisher
National Library of Serbia
Cited by
11 articles.
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