Synchrotron X-ray topography analysis of local damage occurring during polishing of 4H-SiC wafers-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Synchrotron X-ray topography analysis of local damage occurring during polishing of 4H-SiC wafers

Published:2015-08-11 Issue:9 Volume:54 Page:091301
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Sasaki Masayuki,Matsuhata Hirofumi,Tamura Kentaro,Sako Hideki,Kojima Kazutoshi,Yamaguchi Hirotaka,Kitabatake Makoto

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/54/i=9/a=091301/pdf

Reference33 articles.

1. Analysis on Generation of Localized Step-Bunchings on 4H-SiC(0001)Si Face by Synchrotron X-Ray Topography

2. Microstructural Analysis of Damaged Layer Introduced during Chemo-Mechanical Polishing

3. Relation between Defects on 4H-SiC Epitaxial Surface and Gate Oxide Reliability

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Novel Contactless SiC Wafer Planarization Processing after Mechanical Slicing by Dynamic Thermal Annealing Processes;Materials Science Forum;2024-08-21

2. Plasma assisted remediation of SiC surfaces;Journal of Applied Physics;2024-04-15

3. Evaluation of polishing induced subsurface damage in InAs substrates by an acid solution etching method;Materials Science in Semiconductor Processing;2023-11

4. Suppression of In-Grown SF Formation and BPD Propagation in 4H-Sic Epitaxial Layer by Sublimating Sub-Surface Damage before the Growth;Solid State Phenomena;2023-06-06

5. 4H-SiC Full Wafer Mapping Image of CMP-Finished Sub-Surface Damage by Laser Light Scattering;Solid State Phenomena;2023-05-30

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3