Differential-phase-contrast knife-edge scan method for precise evaluation of X-ray nanobeam
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/54/i=9/a=092401/pdf
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1. Real space soft x-ray imaging at 10 nm spatial resolution
2. Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
3. Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region
4. Hard-X-ray imaging optics based on four aspherical mirrors with 50 nm resolution
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