Open circuit voltage decay characteristics of 4H-SiC p–i–n diode with carbon implantation

Author:

Tanaka Atsushi,Nakayama Koji,Asano Katsunori,Miyazawa Tetsuya,Tsuchida Hidekazu

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Surface recombination velocities for 4H–SiC: Dependence of excited carrier concentration and surface passivation;Materials Science in Semiconductor Processing;2024-02

2. 10 kV SiC thyristor for High Voltage Pulsed Power Generators;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19

3. A novel 3.3 kV 4H-SiC trench PiN with enhanced conductance modulation effect;Semiconductor Science and Technology;2022-06-07

4. 13 kV SiC-DMOSFETs and body diodes for HVDC MMC converters;Japanese Journal of Applied Physics;2021-12-22

5. Carrier recombination in SrTiO3 single crystals: impacts of crystal faces and Nb doping;Journal of Physics D: Applied Physics;2021-06-16

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