Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/55/i=8S1/a=08NB05/pdf
Reference51 articles.
1. Separation of interactions by noncontact force microscopy
2. Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions
3. Demonstration of the Casimir Force in the 0.6 to6μmRange
4. Measurement of the Short-Range Attractive Force between Ge Plates Using a Torsion Balance
5. Work-function anisotropies as an origin of long-range surface forces
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Utilizing a forced Van der Pol-Rayleigh-Helmholtz oscillator under heptamodal-frequency operations in Casimir force measurement;Indian Journal of Physics;2024-08-09
2. Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope;Japanese Journal of Applied Physics;2019-06-25
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