Multiple-probe scanning probe microscopes for nanoarchitectonic materials science
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/55/i=11/a=1102A7/pdf
Reference57 articles.
1. Nanoarchitectonics: Pioneering a New Paradigm for Nanotechnology in Materials Development
2. The Way to Nanoarchitectonics and the Way of Nanoarchitectonics
3. Surface Studies by Scanning Tunneling Microscopy
4. Atomic Force Microscope
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