Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate-Reference-Cited by-同舟云学术

Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate

Published:2015-06-10 Issue:7 Volume:8 Page:076601
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Fujiwara Yukio,Saito Naoaki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/8/i=7/a=076601/pdf

Reference23 articles.

1. View from the edge

2. Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

3. Site-Specific Fragmentation of Polystyrene Molecule Using Size-Selected Ar Gas Cluster Ion Beam

4. Novel SIMS system with focused massive cluster ion source for mass imaging spectrometry with high lateral resolution

5. Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams

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