Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample
Author:
Affiliation:
1. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, 1-1-1 Umezono, Tsukuba-shi, Ibaraki-ken 305-8568, Japan
Funder
Japan Society for the Promotion of Science
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
https://avs.scitation.org/doi/pdf/10.1116/6.0001431
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Significant decrease in surface charging of electrically isolated ionic liquid by cluster ion bombardment;Journal of Vacuum Science & Technology A;2024-04-19
2. Optical Emission Characterization of a Single Emitter Electrospray Thruster Interacting With Surfaces;AIAA SCITECH 2023 Forum;2023-01-19
3. Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials;Journal of Vacuum Science & Technology A;2022-09
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