Thicknesses of domain walls in rhombohedral BiFeO3thin films evaluated by scanning nonlinear dielectric microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/53/i=9S/a=09PA13/pdf
Reference35 articles.
1. Domain patterns in epitaxial rhombohedral ferroelectric films. I. Geometry and experiments
2. Domain pattern formation in epitaxial rhombohedral ferroelectric films. II. Interfacial defects and energetics
3. Polarization switching in epitaxial BiFeO3 films
4. Multiferroic BiFeO3films: domain structure and polarization dynamics
5. Spontaneous Vortex Nanodomain Arrays at Ferroelectric Heterointerfaces
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4. Fabrication and physical properties of bismuth layer-structured ferroelectric thin films with c-axis orientation epitaxially grown by high-temperature sputtering;Japanese Journal of Applied Physics;2019-08-23
5. Introduction of charged domain walls into BiFeO3 thin films using a pit-patterned SrTiO3 (001) substrate;Japanese Journal of Applied Physics;2019-08-21
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