Effective Young's Modulus Measurement of Thin Film Using Micromechanical Cantilever Sensors
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference38 articles.
1. AFM as an alternative for Young’s modulus determination in ceramic materials in elastic deformation regime
2. Elastic modulus of polystyrene film from near surface to bulk measured by nanoindentation using atomic force microscopy
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5. A nano-indentation study of the reduced elastic modulus of Alq3 and NPB thin-film used in OLED devices
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1. Molecular Sensing by Micro-Cantilever Sensor with Molecularly Imprinted Polymer Film;2023
2. Transferability of weakest link model parameters of polysilicon from indentation fracture to failure of MEMS structures;Engineering Failure Analysis;2021-09
3. Young's modulus of plasma‐polymerized allylamine films using micromechanical cantilever sensor and laser‐based surface acoustic wave techniques;Plasma Processes and Polymers;2018-06-04
4. Thin Polyelectrolyte Multilayers Made by Inkjet Printing and Their Characterization by Nanomechanical Cantilever Sensors;The Journal of Physical Chemistry C;2014-04-04
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