CMOS-compatible GaN-on-Si HEMTs with cut-off frequency of 210 GHz and high Johnson’s figure-of-merit of 8.8 THz V
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
https://iopscience.iop.org/article/10.7567/1882-0786/ab659f/pdf
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Investigation of the Dislocation Behavior of 6- and 8-Inch AlGaN/GaN HEMT Structures with a Thin AlGaN Buffer Layer Grown on Si Substrates;Inorganics;2024-07-30
2. A Comparative Study of Methods for Calculating the Dislocation Density in GaN-on-Si Epitaxial Wafers;Micromachines;2024-07-25
3. Variable range hopping-assisted parasitic channel leakage in AlN/GaN/AlGaN HEMTs on Si;Applied Physics Letters;2024-07-08
4. High-Al-composition AlGaN/GaN MISHEMT on Si with fT of 320 GHz;Science China Information Sciences;2024-05-23
5. Characteristics study of heterojunction III-nitride/β-Ga2O3 nano-HEMT for THz applications;Engineering Research Express;2024-04-24
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