Fabrication of (Bi,Pr)(Fe,Mn)O3Thin Films on Polycrystalline Diamond Substrates by Chemical Solution Deposition and Their Properties-Reference-Cited by-同舟云学术

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Fabrication of (Bi,Pr)(Fe,Mn)O3Thin Films on Polycrystalline Diamond Substrates by Chemical Solution Deposition and Their Properties

Published:2012-09-01 Issue:9S1 Volume:51 Page:09LA08
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kawae Takeshi,Kawasaki Hiroki,Nakajima Takashi,Tokuda Norio,Okamura Soichiro,Morimoto Akiharu,Takano Yoshihiko

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference30 articles.

1. Ferroelectric Field Effect Transistor Based on Epitaxial Perovskite Heterostructures

2. Impact of HfO2 buffer layers on data retention characteristics of ferroelectric-gate field-effect transistors

3. Effects of Flat HfO2Films Derived from Diethanolamine Solution on Structure and Properties of Metal/Ferroelectrics/Insulator/Semiconductor

4. Comparative Study on Metal–Ferroelectric–Insulator–Semiconductor Diodes Composed of Poly(vinyliden fluoride-trifluoroethylene) and Poly(methyl metacrylate)-Blended Poly(vinyliden fluoride-trifluoroethylene)

5. Growth and Characterization of (Ba0.5Sr0.5)TiO3Films Epitaxially Grown on (002) GaN/(0006) Al2O3Electrode

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Retention properties with high-temperature resistance in (Bi,Pr)(Fe,Mn)O3thin film capacitor;physica status solidi (RRL) - Rapid Research Letters;2014-02-17

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