Extraction Method for Substrate-Related Components of Vertical Junctionless Silicon Nanowire Field-Effect Transistors and Its Verification on Radio Frequency Characteristics
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
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1. RF analysis and noise characterization of junctionless nanowire FETs by a Boltzmann transport equation solver;Journal of Computational Electronics;2019-07-26
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