Reaction pathway analysis for the conversion of perfect screw basal plane dislocation to threading edge dislocation in 4H-SiC
Author:
Funder
JSPS KAKENHI Grant-in-Aid for Scientific Research
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://iopscience.iop.org/article/10.7567/1347-4065/ab2e2e/pdf
Reference73 articles.
1. Material science and device physics in SiC technology for high-voltage power devices
2. Mechanisms of growth and defect properties of epitaxial SiC
3. Step-controlled epitaxial growth of SiC: High quality homoepitaxy
4. Technological Breakthroughs in Growth Control of Silicon Carbide for High Power Electronic Devices
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Charge-transfer interatomic potential to reproduce 30° partial dislocation movements for 4H-SiC in the surface vicinity and its application to BPD-TED conversion;Computational Materials Science;2024-01
2. Long-range Tersoff potential for silicon to reproduce 30° partial dislocation migration;Computational Materials Science;2024-01
3. Review of solution growth techniques for 4H-SiC single crystal;China Foundry;2023-03
4. Effects of constant voltage stress on bipolar degradation in 4H-SiC IGBT;Journal of Crystal Growth;2023-03
5. Origin and Generation Process of a Triangular Single Shockley Stacking Fault Expanding from the Surface Side in 4H-SiC PIN Diodes;Journal of Electronic Materials;2021-09-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3