Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence-Reference-Cited by-同舟云学术

Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence

Published:2019-05-20 Issue:SC Volume:58 Page:SCCC19
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Trivellin Nicola^ORCID,Monti Desiree^ORCID,Piva Francesco^ORCID,Buffolo Matteo^ORCID,De Santi Carlo^ORCID,Zanoni Enrico^ORCID,Meneghesso Gaudenzio^ORCID,Meneghini Matteo^ORCID

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

https://iopscience.iop.org/article/10.7567/1347-4065/ab1393/pdf

Reference35 articles.

1. Current-induced degradation of high performance deep ultraviolet light emitting diodes

2. Degradation of AlGaN-based ultraviolet light emitting diodes

3. Optical studies of degradation of AlGaN quantum well based deep ultraviolet light emitting diodes

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advanced defect spectroscopy in wide-bandgap semiconductors: review and recent results;Journal of Physics D: Applied Physics;2024-08-08

2. Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations;Semiconductor Science and Technology;2024-06-19

3. Undestanding commercial UVC LEDs reliability to boost disinfection efficacy;Light-Emitting Devices, Materials, and Applications XXVIII;2024-03-13

4. The Impact of Time and Temperature of Operation on the Characteristics of High-Power UVC LEDs and Their Disinfection Efficiency;Applied Sciences;2023-11-30

5. Degradation- and Thermal-Related Changes in Selected Electro-Optical Parameters of High-Power 270–280 nm LEDs;Photonics;2023-11-29