Author:
Ohkochi Takuo,Osawa Hitoshi,Yamaguchi Akinobu,Fujiwara Hidenori,Oura Masaki
Abstract
Abstract
A photoemission electron microscope (PEEM) system has been newly installed at the soft X-ray undulator beamline (BL17SU) of SPring-8 to realize time-resolved nanospectroscopy for the local transient electronic structures of advanced materials. This PEEM is a versatile machine composed of an electrostatic lens system and is intended for use in specific experiments such as time-resolved measurements. Pump–probe measurements in tandem with a femtosecond pulsed-laser system and an X-ray chopper are now readily available.
Funder
Japan Society for the Promotion of Science
Ministry of Education, Culture, Sports, Science and Technology
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
7 articles.
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