Observation of Antiferromagnetic Domains in Epitaxial Thin Films-Reference-Cited by-同舟云学术

Observation of Antiferromagnetic Domains in Epitaxial Thin Films

Published:2000-02-11 Issue:5455 Volume:287 Page:1014-1016
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Scholl A.¹,Stöhr J.²,Lüning J.²,Seo J. W.³⁴,Fompeyrine J.³,Siegwart H.³,Locquet J.-P.³,Nolting F.¹,Anders S.¹,Fullerton E. E.²,Scheinfein M. R.⁵,Padmore H. A.¹

Affiliation:

1. Advanced Light Source, 1 Cyclotron Road, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

2. IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120, USA.

3. IBM Research Division, Zürich Research Laboratory, CH-8803 Rüschlikon, Switzerland.

4. Institut de Physique, University of Neuchâtel, CH-2000 Neuchâtel, Switzerland.

5. Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287–1504, USA.

Abstract

Antiferromagnetic domains in an epitaxial thin film, LaFeO 3 on SrTiO 3 (100), were observed using a high-spatial-resolution photoelectron emission microscope with contrast generated by the large x-ray magnetic linear dichroism effect at the multiplet-split L edge of Fe. The antiferromagnetic domains are linked to 90° twinned crystallographic regions in the film. The Néel temperature of the thin film is reduced by 70 kelvin relative to the bulk material, and this reduction is attributed to epitaxial strain. These studies open the door for a microscopic understanding of the magnetic coupling across antiferromagnetic-ferromagnetic interfaces.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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