Evaluation of thermal conductivity characteristics in Si nanowire covered with oxide by UV Raman spectroscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
https://iopscience.iop.org/article/10.7567/1347-4065/ab0889/pdf
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1. Multigate transistors as the future of classical metal–oxide–semiconductor field-effect transistors
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