Improving the atomic-resolution AFM imaging of monolayer MoS2for worn tips: a molecular dynamics study-Reference-Cited by-同舟云学术

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Improving the atomic-resolution AFM imaging of monolayer MoS2for worn tips: a molecular dynamics study

Published:2019-04-12 Issue:5 Volume:58 Page:055003
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Li Minglin,Zhuo Weirong,Pang Haosheng,Lai Lianfeng

Funder

National Natural Science Foundation of China

Natural Science Foundation of Fujian Province

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/58/i=5/a=055003/pdf

Reference56 articles.

1. Atomic Force Microscope

2. Effect of lateral tip stiffness on atomic-resolution force field spectroscopy

3. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy

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