Effect of lateral tip stiffness on atomic-resolution force field spectroscopy-Reference-Cited by-同舟云学术

Effect of lateral tip stiffness on atomic-resolution force field spectroscopy

Published:2013-07 Issue:4 Volume:31 Page:041801
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Uluutku Berkin,Baykara Mehmet Z.

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4807376

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