Emissivity Compensation Utilizing Radiance Distribution in Thermal Images for Temperature Measurement of Electronic Devices
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference6 articles.
1. Thermal and Power Challenges in High Performance Computing Systems
2. In situSi Wafer Surface Temperature Measurement during Flash Lamp Annealing
3. An automatic emissivity-compensated radiation pyrometer
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method;Measurement Science and Technology;2022-10-20
2. Toward Reliable Industrial Radiation Thermometry;International Journal of Thermophysics;2015-04-18
3. Determination of Emissivity by Use of Reflected Thermal Radiation;NCSLI Measure;2015-03
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