Author:
Abu-Issa A.S.,Quigley S.F.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Reference4 articles.
1. The last byte - Yet another thiotimoline application
2. Bardell, P.H., McAnney, W.H., and Savir, J.: ‘Built-in test for VLSI: pseudorandom techniques’, (John Wiley & Sons 1987)
3. DS-LFSR: a BIST TPG for low switching activity
Cited by
17 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Reduced complexity XOR trees for LDPC codes and BS-LFSR techniques to High-Speed memory applications;AEU - International Journal of Electronics and Communications;2023-09
2. Architectural Design of Built in Self-Test for VLSI Circuits using LFSR;2023 International Conference on Applied Intelligence and Sustainable Computing (ICAISC);2023-06-16
3. Design and Implementation of Novel FPGA Based LFSR for IOT and Smart Applications;2022 IEEE International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE);2022-12-30
4. Design of Low Switching Pattern Generator for BIST Architecture;Micro-Electronics and Telecommunication Engineering;2022
5. Adjustable PRPG for Low Power Test Patterns;International Journal of Recent Technology and Engineering;2021-03-30