Affiliation:
1. College of Information Engineering at Shenzhen University Shenzhen City Guangdong Province China
2. Shenzhen Thinkplus Semiconductor Co., Ltd Shenzhen City Guangdong Province China
Abstract
AbstractThe capacitance mismatch problem limits the accuracy improvement of high‐precision SAR ADCs (Successive Approximation Register Analog‐to‐Digital Converters). To address the capacitance array mismatch in SAR ADCs, this paper proposes a novel capacitor calibration scheme based on the Time‐to‐Digital Converter (TDC). This scheme achieves calibration accuracy as high as 0.01% and can be flexibly designed to meet the accuracy requirements of SAR ADCs. Simulation results indicate that the capacitance mismatch issue of a redundant capacitor 13‐bit SAR ADC can be completely eliminated, and the effective number of bits (ENOB) approach the ideal value of 13.18 bits. Additionally, the analog component of this scheme utilizes four inverter chains, two D flip‐flops, and four counters, without requiring a large area for auxiliary calibration capacitors.
Funder
Science, Technology and Innovation Commission of Shenzhen Municipality
National Natural Science Foundation of China
Publisher
Institution of Engineering and Technology (IET)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Design of High-Performance Temperature Sensor Module for Internal Compensation in ASIC Chips;2024 4th International Conference on Electronics, Circuits and Information Engineering (ECIE);2024-05-24