Rapid calibration of bits weights error for high‐resolution successive approximation register ADC

Author:

Liu Lu12,Xu Daiguo2,Xu Shiliu1

Affiliation:

1. University of Electronic Science and Technology of China, the school of Microelectronics and Solid‐state ElectronicsChengdu611731People's Republic of China

2. The Key Laboratory of Analogy Integrated CircuitChongqing400060People's Republic of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Reference20 articles.

1. Li H. Maddox M. Michael C. et al.: ‘A signal‐independent background‐calibrating 20 b 1 MS/s SAR ADC with 0.3 ppm INL’.Int. Solid‐State Circuits Conf. February2018 pp.242–244

2. A 16 bit 16 MS/s SAR ADC with on‐chip calibration in 55 nm CMOS;Shen J.;IEEE J. Solid‐State Circuits Biol.,2017

3. An 18 b 12.5 MS/s ADC With 93 dB SNR

4. LMS based adaptive bit weights error extraction algorithm used in high resolution A/D converters

5. All‐digital background calibration of a successive approximation ADC using the ‘split ADC’ architecture;McNeill J.;IEEE TCAS‐I,2011

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