Novel modified memory built in self‐repair (MMBISR) for SRAM using hybrid redundancy‐analysis technique
Author:
Affiliation:
1. Department of Electronics & Communication EngineeringSchool of Engineering & Technology, Poornima UniversityJaipurRajasthanIndia
2. Department of Electronics & Communication EngineeringArya College of Engineering & ITJaipurRajasthanIndia
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Control and Systems Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cds.2018.5218
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1. Built-in Self-Testing and Design for Testability
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