An Insight into Algorithms and Self Repair Mechanism for Embedded Memories Testing
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-99-4795-9_48
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4. Singh B, Narang SB, Khosla A (2010) Modeling and simulation of efficient march algorithm for memory testing. Commun Comput Inform Sci 95(2):96–107
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