3.3 V CMOS built-in current sensor
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_19970275?crawler=true&mimetype=application/pdf
Reference10 articles.
1. Gulati, R.K., and Hawkins, C.F.: ‘IDDQ testing of VLSI circuits’, (Kluwer Academic Publishers Norwell MA 1993)
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