Scan‐based attack tolerance with minimum testability loss: a gate‐level approach
Author:
Affiliation:
1. Department of Computer EngineeringIran University of Science and TechnologyTehranIran
2. Department of Computer ScienceUniversity of Central ArkansasARUSA
Publisher
Institution of Engineering and Technology (IET)
Subject
Computer Networks and Communications,Information Systems,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-ifs.2019.0444
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1. Mist-Scan: A Secure Scan Chain Architecture to Resist Scan-Based Attacks in Cryptographic Chips;2020 IEEE 33rd International System-on-Chip Conference (SOCC);2020-09-08
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